An Accurate and Efficient Model of Electrical Masking Effect for Soft Errors in Combinational Logic
نویسنده
چکیده
Accurate modeling of the electrical masking effect of soft errors for combinational logic circuits represents a significant challenge in soft error rate analysis. Previous proposed models for electrical masking effect can introduce large estimation error. In this work, we use table lookup MOSFET models to accurately capture the nonlinear properties of submicron MOS transistors. Based on these models, we propose transient pulse generation model and propagation model for soft error analysis. From these models, we derive a fast and efficient method to estimate the electrical masking effect for soft error in combinational logic.
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